Dipl.-Phys. Torsten Scheidt
| Thema der Dissertation: | Charge Carrier Dynamics and Defect Generation at the Si/SiO2 Inteface Probed by Femtosecond Optical Second Harmonic GenerationExterner Link |
| Promotion zum: | Dr. rer. nat. |
| Betreuer: | Prof. Dr. Herbert Stafast |
| Termin der Verteidigung: | 5. Juli 2005 |