Several journals
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Publications

of all research Groups
Several journals
Image: Ira Winkler, IAP (University Jena)

748 Publikationen filtern

Die Publikationen filtern

Highlighted authors are members of the University of Jena.

  1. Adaptive LED illumination with maskless irregular lenslet arrays and controlled crosstalk

    Year of publicationPublished in:Journal of optical microsystems D. Stefanidi, L. Wilhelm, P. Schreiber, P. Schleicher, S. Kleinle, R. Rosenberger, F. Kraze, R. Brüning, A. Tünnermann
  2. Multi-spectral analyses in the VIS-NIR-SWIR for detection of ideal harvesting time and degree of ripeness

    Year of publicationPublished in:Photonic Technologies in Plant and Agricultural Science II: 29–30 January 2025 San Francisco, California, United States A. Ruvalcaba-Perez, G. Siess, N. Janunts, V. Boehm, A. Tuennermann
  3. Second harmonic generation in iridium and iridium/Al₂O₃ heterostructure coatings

    Year of publicationPublished in:Optical Materials Express P. Paul, R. Rafi, S. Beer, O. Ghaebi, S. Klimmer, G. Soavi, S. Nolte, S. Schröder, A. Tünnermann, A. Szeghalmi
  4. Submicrometer Defect Detection and Classification by Angle Resolved Light Scattering

    Year of publicationStatusReview pendingPublished in:Optical Interference Coatings, OIC 2025 in Proceedings Optica OIC - Optical Interference Coatings Conference 2025 S. Schröder, A. Munser, S. Ma, T. Herffurth, T. Gischkat, C. Mühlig, A. Tünnermann
    University Bibliography Jena:
    fsu_mods_00027212External link
  5. W/Si Multilayer Mirrors for Soft X-Ray Wavelengths < 2.4 nm

    Year of publicationStatusReview pendingPublished in:Surfaces D. Sevriukov, S. Yulin, S. Schröder, A. Tünnermann
    W/Si multilayer mirrors are a promising candidate for soft X-ray applications at wavelengths below 2.4 nm. However, their optical performance is strongly affected by interface roughness and interlayer mixing, which limits reflectivity. One approach to improving interface quality is the application of BIAS voltage during deposition. In this study, W/Si multilayer mirrors with bilayer thickness of ~1.5 nm and 100 bilayers were fabricated using DC magnetron sputtering, with ion assistance of 75 V, 100 V, and 200 V applied during the deposition of silicon layers. Grazing incidence X-ray reflectivity (GIXR) measurements at Cu Kα (λ = 0.154 nm) showed that applying BIAS ≤ 100 V reduced interface roughness and increased reflectivity, with a maximum effect observed at 75 V. In contrast, at 200 V, strong diffusion intermixing reduced the bilayer thickness to 1.29 nm and nearly eliminated reflectivity. Soft X-ray reflectivity measurements at λ ~ 1.5 nm confirmed that ion assistance improved optical performance, increasing mirror reflectivity from ~1% (BIAS = 0 V) to ~2.3% (BIAS = 75 V). Atomic force microscopy (AFM) measurements also demonstrated a reduction in surface roughness from 0.22 nm to 0.11 nm due to using ion assistance. These results indicate that moderate ion assistance (<100 V) can enhance the optical quality of W/Si multilayer mirrors by reducing interface roughness, while excessive BIAS (>100 V) leads to diffusion intermixing and optical degradation. The novelty of this work lies in the direct application and variation in BIAS voltage during Si-layer growth, enabling detailed investigation of its influence on interface roughness and reflectivity. This approach provides a simple and effective tool for optimizing the performance of W/Si multilayer mirrors for soft X-ray applications.
    University Bibliography Jena:
    fsu_mods_00027962External link
  6. Precision manufacturing of multicore fibers for superior fiber laser performance

    Year of publicationPublished in:Fiber Lasers XXII: Technology and Systems N. Haarlammert, J. Nold, S. Kuhn, C. Jauregui, J. Limpert, T. Schreiber
  7. Pulse energy scaling of ultrafast lasers via spectral-temporal shaping and coherent combination

    Year of publication L. Stark
    University Bibliography Jena:
    fsu_mods_00019662External link
  8. 18-mJ pulse energy, 27-W average power, second harmonic generation in a Q-switched 49-core Yb-doped fiber laser

    Year of publicationPublished in:Fiber Lasers XXII: Technology and Systems M. Bahri, A. Klenke, C. Jauregui, J. Nold, N. Haarlammert, T. Schreiber, J. Limpert
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